发明名称 REACTIVE PLASMA PROCESS AND APPARATUS THEREFOR
摘要 <p>The quality of a plasma etching process is improved by applying a DC potential (28') to one of the energizing electrodes (12') in the reaction chamber (11').The DC potential withdraws a small current from the plasma which causes the reaction to produce a uniform, controllable self-bias on the workpiece placed on the opposite (or second) electrode.</p>
申请公布号 GB2067137(B) 申请公布日期 1983.08.10
申请号 GB19800040991 申请日期 1980.12.22
申请人 WE 发明人
分类号 H01L21/302;H01J37/32;H01L21/3065;(IPC1-7):01J37/32;30B33/00 主分类号 H01L21/302
代理机构 代理人
主权项
地址