发明名称 CALIBRATING DEVICE OF ULTRASONIC MEASURING SYSTEM FOR THICKNESS DEVIATION
摘要 PURPOSE:To check the operations of a titled system quickly, simply and easily by using test pieces for prescribed max. and min. wall thickness parts, generating spurious signals by switch operations and performing system simulation. CONSTITUTION:The wall thicknesses of a test piece 1 provided with prescribed max. wall thickness parts and min. wall thickness parts are measured with an normal probe 2, an ultrasonic thickness gage 3 of pulse reflection type and after the thickness are written in a max. wall thickness troage device 4 and a min. wall thickness storage device 5, the thicknesses are read out and an automatic continuous measuring system for thickness deviations in the circumferential and axial directions of a metallic pipe 1' by a rotary probe 2' is calibrated. If a gate is controlled to a calibration mode by changing over the measurement/calibration mode selector of a calibrating device 16 for thickness deviation, the writing and reading out of the devices 4, 5 are controlled by the spurious signals outputted by a control timing pulse generator 17 according to each of the operation of the discriminating switch and the operation of the read switch of the device 16, whereby system simulation is accomplished. Thus, the operations for calibration of the ultrasonic measuring system for thickness deviation are checked quickly, simply and easily.
申请公布号 JPS58129254(A) 申请公布日期 1983.08.02
申请号 JP19820012115 申请日期 1982.01.28
申请人 TOKYO KEIKI KK;SUMITOMO KINZOKU KOGYO KK 发明人 TAKAHASHI NOBUO;FURUKAWA YASUYUKI;INOUE SABUROU
分类号 G01N29/30 主分类号 G01N29/30
代理机构 代理人
主权项
地址