发明名称 ABNORMAL STATE DETECTING DEVICE
摘要 PURPOSE:To elevate the detection accuracy, by detecting an abnormal state of a plant, from an output of a model value of the plant, an output difference of a measured value, and a time variation factor of this output difference. CONSTITUTION:From a computer 11, a model value (x) of a plant is outputted, and from a measuring instrument 12, a measured value (y) of the plant is outputted. As for these values, its difference is derived by a subtracter 13, and subsequently, an absolute value 14 is derived. Also, an output of the subtracter 13 is differentiated 15, and an absolute value 16 is derived. Subsequently, in an adder 17, outputs of the absolute value operators 14, 16 are added, and after that, a threshold level of a setting device 19 is subtracted 18, positive or negative is decided 20, and an abnormal state is displayed 21.
申请公布号 JPS58124909(A) 申请公布日期 1983.07.25
申请号 JP19820008554 申请日期 1982.01.22
申请人 MITSUBISHI JUKOGYO KK 发明人 MURATA RIYOUICHI;FUJIWARA TOSHIKATSU
分类号 G01D1/18;G01D1/16;G01D21/00;G05B23/02 主分类号 G01D1/18
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