发明名称 Swept-dip probe
摘要 The present invention relates to the design and fabrication of a probe, ancillary signal conditioning circuits with display circuits and related equipment required to measure the resonate frequency and display the shape of the resonance curve. The probe uses the energy absorbing method of indicating these parameters. A graphical display or an analog meter dip indicates the resonant frequency. A digital frequency meter can measures the frequency points precisely.
申请公布号 US4394617(A) 申请公布日期 1983.07.19
申请号 US19810298657 申请日期 1981.11.18
申请人 WAMPLER, E. LAWRENCE 发明人 WAMPLER, E. LAWRENCE
分类号 G01R23/07;G01R27/26;(IPC1-7):G01R27/00 主分类号 G01R23/07
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