发明名称 DEFECT DETECTING CIRCUIT FOR THYRISTOR DEVICE
摘要 PURPOSE:To improve the sampling accuracy of a gate pulse output by detecting the presence or absence of a gate pulse and providing a pulse detecting circuit for shaping the pulse in a suitable pulse width. CONSTITUTION:A pulse detecting circuit detects the output pulse train from an armature gate circuit, is triggered by the rise signal of the pulse, and is converted to a signal having the predetermined pulse width. Data (c) is detected when the data is converted to the pulse width of the time tauP and the pulse signals U,..., Y of the sampling period tauC are connected via connected via an interface circuit to data bus D0,..., D5. Thus, the data (c) is judged with other voltage, current, speed and calculated data and defect signals stored at the same sampling time, thereby performing the accurate and rapid defect detection.
申请公布号 JPS5895978(A) 申请公布日期 1983.06.07
申请号 JP19810196170 申请日期 1981.12.02
申请人 MITSUBISHI DENKI KK 发明人 KAIKOU TOORU;MIHASHI MASAMICHI;KAWAI JIYOUJI
分类号 H02H7/12;H02M1/00;H02M1/084;H03K17/73 主分类号 H02H7/12
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