发明名称 Structured copper strain buffer
摘要 A structured copper strain buffer, which is thermally and electrically conductive is provided for use with semiconductor electronic devices. A thermo-compression diffusion bond is used to attach a metallic foil to a structured copper disk to form the strain buffer. The individual strands of copper within the strain buffer are capable of independent movement. The structured copper strain buffer provides a means of attachment to a semiconductor device without causing a stress to be generated at the attached surface of the device as the device expands and contracts with temperature changes.
申请公布号 US4385310(A) 申请公布日期 1983.05.24
申请号 US19780944372 申请日期 1978.09.21
申请人 GENERAL ELECTRIC COMPANY 发明人 HOUSTON, DOUGLAS E.
分类号 H01L21/52;H01L21/58;H01L23/02;H01L23/04;H01L23/36;H01L23/373;H01L23/49;H01L23/492;(IPC1-7):H01L23/48;H01L29/46;H01L29/62 主分类号 H01L21/52
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