发明名称 METHOD FOR CHECKING DEFECT IN MULTICOLOR PATTERN
摘要 PURPOSE:To extract the defects in the multicolor pattern at a high speed, by providing a plurality of different binary coding circuits in correspondence with the kinds of the defects, combining the binary coded images obtained from the circuits, thereby judging the kinds of the defects. CONSTITUTION:The multicolor pattern of an object to be checked 5 is transduced into an image pickup signal by a photoelectric transducer 7 for checking, through an expanding lens system 6. The image signal is inputted to the binary coding circuits 8-11. The binary coding is performed, with the abnormal part of the image signal as a ''1'' and the normal part as a ''0''. A plurality (4) of the binary coding circuits are provided in correspondence with the kinds of the defects. By changing the parameters in the circuits, slicing level at which the ground pattern can be erased, is set. The dotted images corresponding to the specific defects are displayed on a plurality of television sets 24-27 which are connected to the circuits 8-11. In this way, the specific kinds of the defects are extracted at the high speed without the AD conversion.
申请公布号 JPS5868630(A) 申请公布日期 1983.04.23
申请号 JP19810167587 申请日期 1981.10.20
申请人 TOPPAN INSATSU KK 发明人 NISHIMOTO TOYOJI;IWASAKI MITSUHIRO;OZAWA TATSUROU
分类号 G01J3/50;G01N21/88;G01N21/94;G01N21/956;G01N21/958 主分类号 G01J3/50
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