发明名称 Measuring device for local electrical conductivity of plasma
摘要 The measuring device for local electrical conductivity contains a probe (1) which is connected in force-locked manner to a drive device (2) and a series circuit consisting of an inductive transmitter (3), a measurement generator (4) and a detector (5), the output of which is connected via an optoelectronic transducer (13) to a differential stage (9) with a change-over switch (10) and to a storage element (11). The output of the differential stage (9) is connected to one input of a recording measuring instrument (12), the other input of which is connected to a command transmitter (8) which is electrically coupled to an electropneumatic unit (6) in which pressure valves of the advancing device (2 and 15) for the probe and, respectively, a calibration crystal are accommodated which are connected via hoses (6') to compressed-air cylinders (21 and 28) of these devices (2 and 15). <IMAGE>
申请公布号 DE3138959(A1) 申请公布日期 1983.04.14
申请号 DE19813138959 申请日期 1981.09.30
申请人 INSTITUT VYSOKICH TEMPERATUR AKADEMII NAUK SSSR 发明人 PAVLOVIC NEFEDOV,ANATOLIJ;MIKHAILOVIC OBERMAN,FELIX;GRIGORIEVIC KATOSIN,JURIJ;IOSIFOVIC KRUGLIJ,SEMEN;PETROVIC MALJUCHONOK,GENNADIJ;SERGEEVIC MICHAILOV,JURIJ
分类号 G01R27/22;H02K44/08;(IPC1-7):G01R27/22 主分类号 G01R27/22
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