发明名称 CIRCUIT TESTING METHOD DUE TO ROM DATA
摘要 PURPOSE:To prevent the error of setting of test data and simplify the operation, by writing preliminarily required data in an ROM and performing the test while renewing the read address of this ROM step by step. CONSTITUTION:Address data and control data required for the test are stored preliminarily in an ROM5 in a prescribed address order and are read out successively by an address signal from the external which is renewed successively. Data outputted from the ROM5 are set to an address register 1 and a data register 2 respetively, and simultaneously, control data from the data register 2 is set to a specific data register in a circuit 3 to be tested. A lighting circuit for indicating lamp or the like is tested by this control data. Thus, the error of setting of test data is prevented, and the operation is simplified.
申请公布号 JPS5858480(A) 申请公布日期 1983.04.07
申请号 JP19810157486 申请日期 1981.10.05
申请人 HITACHI SEISAKUSHO KK 发明人 SENDA SUSUMU
分类号 G01R31/28;G01R31/317;G01R31/3183 主分类号 G01R31/28
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