发明名称 ELECTRONIC CIRCUIT TESTER
摘要 PURPOSE:To achieve a quick measurement at a high accuracy as compared with the waveform observation with an oscilloscope by comparing the rising and falling of output waveforms with a standard value of a reference pulse to determine the quality thereof to pulse response. CONSTITUTION:Pulses with a peak value A and a pulse width to are inputted into a sample 2 to be measured from a first reference pulse generator 1. Outputs of the sample 2 are inputted into a first comparator 3 and sliced with a reference voltage VS equivalent to alpha% of the reference peak value A to test the quality of the pulse width with a gate circuit 5 and a reference clock pulse generator 6. On the other hand, output pulses of the sample 2 are inputted into a second comparator 8 and a third comparator 9 to test the rising and the falling of the pulses and the peak value and 0 level thereof. The third comparator 9 uses a trigger signal phib corresponding to the inner edge of the outputs pulses to perform a similar test to the second comparator. The results of the second and third comparators 8 and 9 are inputted into a test judging circuit 11 composed of a latch circuit through an OR gate 10 to determine the quality of the sample 2 being measured.
申请公布号 JPS5855872(A) 申请公布日期 1983.04.02
申请号 JP19810154964 申请日期 1981.09.30
申请人 FUJITSU KK 发明人 KAWAMATA SEIICHI
分类号 G01R31/28;G01R29/027;G01R31/319;(IPC1-7):01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址