发明名称 COMPARISON TESTING CIRCUIT OF LOGICAL CIRCUIT DEVICE
摘要 PURPOSE:To exactly decide whether the functional characteristics are good or not, and to shorten its measuring time, by utilizing the output characteristics of a logical circuit device controlled by a polyphase clock. CONSTITUTION:An output outputted from a standard sample (STD) 3 is detected by an output detecting circuit 12, and by its detecting signal, a frequency dividing circuit 10 for frequency-dividing an external clock pulse to 1/3 is operated. The clock pulse which has been frequency-divided to 1/3 by this frequency dividing circuit is delayed by a delaying circuit 13 to a phase which is not concerned in each output generating operation of the STD3 and a sample to be measured DUT4, and is outputted. A delayed 1/3 frequency-divided pulse which has been synchronized with an external input clock pulse is outputted from the delaying circuit 13. This pulse is processed by a dissidence detecting pulse generating circuit 7, a dissidence detecting pulse is obtained, and whether the DUT4 is good or not is decided by applying said pulse to a dissidence detecting and deciding circuit 8.
申请公布号 JPS5831456(A) 申请公布日期 1983.02.24
申请号 JP19810128556 申请日期 1981.08.17
申请人 MATSUSHITA DENSHI KOGYO KK 发明人 NAKAO REIJI;USUI SHIYUNICHI
分类号 G01R31/28;G06F11/22 主分类号 G01R31/28
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