| 摘要 |
PURPOSE:To reduce the test time by about half comparing with a test time of the conventional bubble memory, by carrying out simultaneously both the reading and writing cycle tests. CONSTITUTION:In the reading cycle, a test address is prescribed by a read address counter 2 for reading cycle, and then a function pulse is generated from a function timing generator 13 to drive the bubble. The bubble output is fed to a data comparator 19 through a sense circuit 18 for checking the presence or absence of an error. On the other hand, a write test address for write is prescribed by a write address counter 21 for write cycle. Then the function timing pulse is generated from the generator 13, and a driving circuit is driven. Thus a data is written into a magnetic bubble memory 10a. |
