发明名称
摘要 A P-conductivity type resistor layer 12 is formed in the main surface of a silicon substrate 11, and extends along a crystal axis of [001] where the main surface is a crystal face of (110), or else it extends along a [010] or [001] axis in the case of a (100) face main surface. It has been found that the resistance value of a P-conductivity type resistor layer of such orientation is less affected than other orientations in the same plane by the thermal stresses induced in the layer by the shrinkage of a plastics resin envelope 18 during the moulding thereof. <IMAGE>
申请公布号 FR2396413(B1) 申请公布日期 1983.01.14
申请号 FR19780019523 申请日期 1978.06.29
申请人 TOKYO SHIBAURA DENKI KK 发明人
分类号 H01L23/31;H01L29/04;H01L29/8605;(IPC1-7):H01L29/36;H01C13/00;H01L27/04 主分类号 H01L23/31
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