| 摘要 |
PURPOSE:To reduce the size of a chip by commonly using the measuring pads of the adjacent chips, thereby reducing the area of the chips occupied by the pads. CONSTITUTION:In case of measuring a chip 1, an element 15 is varied to low resistance by the voltage of a probe applied to a terminal 16, but no voltage is applied to the terminal 16' of a chip 2 which is not measured. Accordingly, an element 15' is high resistance. Thus, a measuring electric signal applied by the probe to a measuring pad 13 is transmitted through the element 15 to the internal circuit of the chip 1, but the chip 2 is insulated via the element 15'. In this manner, a voltage is applied to the element which electrically connects the measuring pad to the internal circuit via low resistance and at least one terminal to be controlled may be sufficient enough, thereby the chip area does not occupy largely. |
