发明名称 DISTURBANCE RESISTANCE MAGNETIC CHARACTERISTIC TESTING METHOD OF MAGNETIC BUBBLE MEMORY
摘要 PURPOSE:To simplify a testing device, by providing a bias coil in the inside of a magnetic shielding body of a magnetic bubble memory chip, and testing a disturbance resistance magnetic field characteritic by making a disturbance current flow into this bias coil and a driving coil. CONSTITUTION:On the circumference of a magnetic bubble memory chip 5, driving coils 3, 4 for generating a rotation driving magnetic field and permanent magnets 2, 6 for forming a bias magnetic field are placed, and the external magnetic field is shielded by a shielding case 1. Also, in the inside of the shielding case 1, a bias coil 12 is placed, of which a magnetic bubble memory device is constituted. In this state, a current which has superposed a disturbance current on a driving current is made flow to the driving coils 3, 4 also a current which has superposed the disturbance current on a bias current is made to flow to the bias coil 12, an artificial disturbance magnetic field is generated, and a test of a disturbance resistance magnetic field is executed. In this way, an especially large-sized testing device becomes unnecessary, and the device is simplified.
申请公布号 JPS57200986(A) 申请公布日期 1982.12.09
申请号 JP19810085265 申请日期 1981.06.03
申请人 FUJITSU KK 发明人 NAKAMURA KAN
分类号 G11C11/14;G11C19/08 主分类号 G11C11/14
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