| 摘要 |
PURPOSE:To make the accurate measurement of the thickness of alloy plating without contact possible by separating the fluorescent X-rays radiated secondarily by X-ray irradiation to those from the underlying metal and from the plating and measuring the intensities of the respective components. CONSTITUTION:When X-rays 13 are irradiated to a steel plate 2 applied with composite plating 3 of Ni and Zn, fluorescent X-rays 14 are radiated secondarily. Since the fluorescent X-rays are radiated from Fe, Ni, Zn respectively, Fe fluorescent X-rays 14a, and Ni fluorescent X-rays 14b are extracted through a filter 15 consisting of Fe and a filter 16 consisting of Ni. The outputs D1, D2 corresponding to the intensities of the respective fluorescent X-rays are obtained from the pulses P1, P2 from ionization boxes 17, 18 and are inputted to a CPU23. From the difference in these two signals, an Ni-content data is obtained, from which the data on the intensity of the Fe fluorescent X-rays is corrected. Since the intensity of the Fe fluorescent X-rays decreases with an increase in the thickness of the plating, the thickness of the plating is operated from this relation. |
