发明名称 MECHANISMS FOR FORMING METAL-INSULATOR-METAL (MIM) CAPACITOR STRUCTURE
摘要 A method for forming a metal-insulator-metal (MIM) capacitor structure is provided. The method includes providing a substrate and forming an interconnect structure over the substrate. The interconnect structure includes a top metal layer, and wherein the top metal layer includes a first portion and a second portion. The method includes forming an insulating layer on the first portion of the top metal layer; and forming a metal pad on the insulating layer. The metal pad includes a first portion and a second portion, the MIM capacitor is constructed by the first portion of the top metal layer, the insulating layer and the first portion of the metal pad, and the second portion of the metal pad directly contacts the first portion of the metal pad and the second portion of the top metal layer.
申请公布号 US2016233158(A1) 申请公布日期 2016.08.11
申请号 US201615131867 申请日期 2016.04.18
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 JEN Chi-Chung;HSU Chia-Lun
分类号 H01L23/522;H01L23/00;H01L49/02 主分类号 H01L23/522
代理机构 代理人
主权项 1. A method for forming a metal-insulator-metal (MIM) capacitor structure, comprising: providing a substrate; forming an interconnect structure over the substrate, wherein the interconnect structure comprises a top metal layer, and wherein the top metal layer comprises a first portion and a second portion; forming an insulating layer on the first portion of the top metal layer; and forming a metal pad on the insulating layer, wherein the metal pad comprises a first portion and a second portion, the MIM capacitor is constructed by the first portion of the top metal layer, the insulating layer and the first portion of the metal pad, and the second portion of the metal pad directly contacts the first portion of the metal pad and the second portion of the top metal layer.
地址 Hsinchu TW