发明名称 CHARGED PARTICLE BEAM TYPE LITHOGRAPHIC METHOD
摘要 PURPOSE:To form an ultrafine pattern with a charged particle beam by sequentially repeatedly emitting the regions to be emitted until sufficiently large dissolving velocity ratio to a developer between the emitter part and non-emitted part of a charged particle sensitive layer is incorporated. CONSTITUTION:A figure is divided into emitting regions of the size of several tens nm to several tens mum, charged particle beam is emitted to the first emitting region 5 of the first set 4 for the time t0 not to produce thermal change of properties with more than two emitting regions as a set isolated at a distance of 4(Dt0)<1/2> between the emitting regions, where Dcm/sec represents thermal diffusion rate obtained by dividing the thermal conductivity of a substrate by the product of a specific heat CJule/g.deg and density rhog/cm, and t0sec represents the continuous emitting time of the respective emitting regions. Therafter, next emitting regions 6, 7 are sequentially continued as designated by an arrow 8, and all the emitting regions in the first set 4 are emitted. While the other emitting regions are thus emitted. The first emitting regions 5 are cooled by the thermal conduction in the substrate, and after the emission of the first set 4 is completed, it is transferred to the second set 11, and similar procedure is continued to the first set 4.
申请公布号 JPS57162337(A) 申请公布日期 1982.10.06
申请号 JP19810047394 申请日期 1981.03.31
申请人 NIPPON DENKI KK 发明人 HASEGAWA SHINYA
分类号 H01L21/027;H01J37/317;(IPC1-7):01L21/30 主分类号 H01L21/027
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