发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of suppressing breakage of the semiconductor device in a reverse recovery state.SOLUTION: A semiconductor device according to an embodiment has: a first semiconductor region of a first conductivity type, a first electrode, a second electrode, a third electrode, a first insulation part, a second insulation part, a second semiconductor region of a second conductivity type, a third semiconductor region of the first conductivity type, a fourth semiconductor region of the second conductivity type, and a fourth electrode. The second electrode has a first electrode portion and a second electrode portion. The second electrode portion extends in a first direction. The second electrode portion is provided between a plurality of first electrode portions and the first electrode in a second direction. The fourth semiconductor region is located between the adjacent first electrode portions in the first direction.SELECTED DRAWING: Figure 4
申请公布号 JP2016167559(A) 申请公布日期 2016.09.15
申请号 JP20150047417 申请日期 2015.03.10
申请人 TOSHIBA CORP 发明人 KAWAGUCHI YUSUKE
分类号 H01L29/06;H01L29/78 主分类号 H01L29/06
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