发明名称 VOLTAGE MEASURING DEVICE USING ELECTRON BEAM
摘要 PURPOSE:To prevent the functional form of a decelerating voltage for analysis to the output of a secondary electron quantity detector from following the decelerating voltage to change, by providing a hemispherical net-shaped buffer electrode between a leading-out electrode and a decelerating electrode for analysis. CONSTITUTION:An electron gun 2 in a vacuum vessel 1 irradiates an electron beam 3 to a sample 4, and secondary electrons 5 are generated from the sample 4. The potential of a leading-out electrode 6 is more positive than that of the sample 4, and a decelerating electrode 7 for analysis controls the quantity of secondary electrons incident to a secondary electron quantity detector 8. Meanwhile, a hemispherical buffer electrode 9 having the form similar to the leading- out electrode 6 and the decelerating electrode 7 is provided between these electrodes, and a voltage 50-100V is applied to the buffer electrode 9. Only the decelerating voltage is changed as a parameter to obtain such decelerating voltage that the output of the secondary electron quantity detector becomes constant and a potential difference between samples is obtained on a basis of the difference between these decelerating voltages. Thus, the energy resolution is improved, and the analysis characteristics are improved because of no influence of the decelerating voltage.
申请公布号 JPS57161556(A) 申请公布日期 1982.10.05
申请号 JP19810047106 申请日期 1981.03.30
申请人 FUJITSU KK 发明人 ITOU AKIO;GOTOU YOSHIAKI
分类号 G01R19/155;G01R19/00;G01R31/302;G01R31/305;(IPC1-7):01R19/00 主分类号 G01R19/155
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