发明名称 METHOD FOR TESTING LOGICAL OPERATION CIRCUIT
摘要 PURPOSE:To raise a strobe signal in a time other than the noise generation time, by performing simulation with a waveform where indefinite value of an input are inserted in both sides of the switching time of the input pattern. CONSTITUTION:Patterns including indefintite values of a time width corresponding to variances among test input pins 1, 4, and 5 are inputted to test pattern inputs (a), (b), and (c) at the switching time of a pattern to perform a simulation; and if indefinite values are propagated in a gate, the time of noise generation due to the time difference among input pins 1, 4, and 5 and the variance of the threshold of the gate is detected at the test data generation time. As the result, a strobe signal is raised at a time other than the noise generation time.
申请公布号 JPS57127254(A) 申请公布日期 1982.08.07
申请号 JP19810011672 申请日期 1981.01.30
申请人 HITACHI SEISAKUSHO KK 发明人 IGARASHI TOSHIO
分类号 G01R31/28;G01R31/317;G01R31/319;G06F11/22;G06F17/50 主分类号 G01R31/28
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