| 摘要 |
PURPOSE:To eliminate useless contact re-tests by a method wherein a contact re-test is performed only when electric contact between an IC electrode and a contactor contact is proved in a contact test to be faulty. CONSTITUTION:A first concurrence detecting circuit 3 yields an output only when two values, one arbitrarily set in the device program or outputted by a test number counter 1 increasing by one when a test is completed and the other outputted by an arbitrarily changeable setting resistor 2, concur. A second concurrence detecting circuit 4 yields an output only when both an output of the first concurrent circuit 3 and a no-good signal 5 are present. The concurrence detecting circuit 4 output is supplied to a handler's re-contact signal 6 terminal and the handler conducts a contact re-test for the concurned IC only when a circuit 4 output is present. |
