,申请号JP19810003743U-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称
摘要
申请公布号	JPS57121663(U)	申请公布日期	1982.07.28
申请号	JP19810003743U	申请日期	1981.01.14
申请人		发明人
分类号	C21D1/00;(IPC1-7):C21D1/00	主分类号	C21D1/00
代理机构		代理人
主权项
地址

您可能感兴趣的专利

TONER AND ITS MANUFACTURING METHOD

GRADATION VOLTAGE SELECTION CIRCUIT AND DISPLAY CONTROL CIRCUIT

ECCENTRICITY INSPECTING DEVICE AND ECCENTRICITY ADJUSTING DEVICE

DEVELOPING BODY, DEVELOPING DEVICE, AND IMAGE FORMING APPARATUS

STREAM ENCRYPTION METHOD, DECRYPTION METHOD, AND ENCRYPTION ALGORITHM AND DECRYPTION ALGORITHM BASED ON PI-DATA

PLASMA DISPLAY DEVICE

OPTICAL DEFLECTION APPARATUS, IMAGE FORMING APPARATUS, AND METHOD OF DRIVING OPTICAL DEFLECTION APPARATUS

RADIATION MEASURING DEVICE AND YIELD DETECTION DEVICE OF RADIOACTIVE LIQUID

MASS FLOW MEASURING DEVICE

SOCKET BOARD CIRCULATING STRUCTURE OF SEMICONDUCTOR DEVICE TESTING SYSTEM

STATE QUANTITY MEASUREMENT DEVICE FOR ROLLING BEARING UNIT

LIQUID CHROMATOGRAPHY

TIRE TESTING DEVICE AND METHOD

NONDESTRUCTIVE INSPECTION DEVICE AND NON-DESTRUCTIVE INSPECTION METHOD

SENSOR FOR SURFACE INCLINATION AND METHOD OF DETECTING SAME

QUANTITATIVE ANALYSIS METHOD USING MASS SPECTROMETER

X-RAY INSPECTION DEVICE AND METHOD

FLUORESCENCE DETECTOR AND LIQUID CHROMATOGRAPHY EQUIPPED WITH SAME

NANOWIRE CROSSLINKING DEVICE UTILIZABLE FOR SHAPE MEASUREMENT OF ELECTRON BEAM