| 摘要 |
PURPOSE:To reduce remarkably the storing capacity and at the same time, and to reduce the requirement of time for a test and to facilitate check on an integrated circuit by storing only as much number of bits as required for effective data and effective/noneffective data in a storage device. CONSTITUTION:With scan in/out data TO as test input data, the number of effective data bit of the data TD, n1, n2,... are written in the first memory RG as binary value information of 0, 1, and both the number of vacant data bit m1, m2,... and the number of noneffective data bit n1, n2... are written in the second memory MEM. In a flag F indicating effective or noneffective to the memory MEM, 1 or 0 is written. Further, every input of a clock CLK applies -1 to a preset counter CTR, and when the CTR is reduced to zero, the flag F of memory MEM is fetched in the FF and added to the memory RG through a gate G, and number of data bit, n1, n2,... is input sequentially in synchronizing with the clock CLK to the FF group of an integrated circuit 10. Thus the capacity of memory is reduced and check on the circuit 10 is facilitated. |
