发明名称 CORRECTING METHOD OF MASK
摘要 PURPOSE:To correct a mask by changing a metal layer on a substrate on a transparent glass into a transparent oxide by annealing using electron beam, laser beam, infrared or ultraviolet rays in heated oxide atmosphere. CONSTITUTION:A fine Cr mask pattern 2 on a glass substrate 1 is radiated by convergent laser beam while controlling atmosphere by O2 gas 3. The O2 gas is heated to keep the substrate at high temperatures to prevent hillock or peeling of a pattern due beam heating. The repetition of the irradiation will prove effective. This annealing evaporates a part of Cr leaving the most part being oxidized and almost transparent. Unnecessary part of the mask is removed as if etched chemically making the correction accurate in a short time.
申请公布号 JPS5787128(A) 申请公布日期 1982.05.31
申请号 JP19800161880 申请日期 1980.11.19
申请人 TOKYO SHIBAURA DENKI KK 发明人 KOBAYASHI KEIJI
分类号 G03F1/00;G03F1/72;G03F1/74;H01L21/027 主分类号 G03F1/00
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