发明名称 Semiconductor device and method for manufacturing the same.
摘要 <p>A semiconductor device comprising a semiconductor element formed in a semiconductor region (200) of a first conductivity type with a gate electrode (222) made of refractory metal and an impurity region (226, 228). An insulating layer (218) is formed, at least partially buried, in a given region of the semiconductor region (200). Formed on the insulating layer is a metal interconnection layer (224) integral with the gate electrode made of refractory metal. In the semiconductor region right under the insulating layer (218), an impurity diffusion layer (214) having impurity of a second conductivity type is formed in contact with the insulating layer (218).</p>
申请公布号 EP0052475(A2) 申请公布日期 1982.05.26
申请号 EP19810305345 申请日期 1981.11.11
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SATO, MASASHI;ISHIBASHI, MASAYUKI;KOBAYASHI, ICHIRO
分类号 H01L21/74;H01L23/522;H01L27/092;H01L29/06;H01L29/78;(IPC1-7):01L29/78;01L23/52;01L27/08;01L21/70;01L21/00 主分类号 H01L21/74
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