发明名称 |
Polishing appts. for small mineral samples e.g. dust particles - has rotatably mounted sample carrier, perpendicular to and below polishing surface, which can be bought under telescope |
摘要 |
<p>The device contains a sample-holder placed on a support mounted on a carriage moving along fixed guiding rails. The position of the support can be adjusted vertically and horizontally. The carriage moves between two positions. In one position, the sample-holder is placed exactly under a polishing plate rotating round a vertical axis. In the other position, the sample-holder is placed exactly under the lens of a microscope which is mounted on a fixed support. With this device, the polishing can be easily and better controlled as the sample is instantly located after each polishing phase. Furthermore the polishing cannot go beyond a predetermined level. To each adjustment element is associated a measuring scale.</p> |
申请公布号 |
FR2492099(A1) |
申请公布日期 |
1982.04.16 |
申请号 |
FR19800021894 |
申请日期 |
1980.10.14 |
申请人 |
BUREAU RECHERCHE GEOLOG MINIERE |
发明人 |
RENE CAYE ET JACQUES DUFORT;DUFORT JACQUES |
分类号 |
B24B37/04;G01N1/32;(IPC1-7):01N1/32 |
主分类号 |
B24B37/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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