发明名称 Process and gas mixture for etching silicon dioxide and silicon nitride
摘要 Process and gas mixture for etching silicon dioxide and/or silicon nitride in a plasma environment in a planar reactor. The gas mixture comprises a primary etching gas and a secondary gas which controls the selectivity of the etch. The process is carried out at relatively high pressure and power levels and provides substantially faster removal of silicon dioxide and/or silicon nitride than has heretofore been possible in planar reactors.
申请公布号 US4324611(A) 申请公布日期 1982.04.13
申请号 US19800163386 申请日期 1980.06.26
申请人 BRANSON INTERNATIONAL PLASMA CORPORATION 发明人 VOGEL, DIANE C.;TANG, MARIAN C.;REICHELDERFER, RICHARD F.
分类号 H01L21/311;(IPC1-7):H01L21/30;C03C15/00;C03C25/06;B44C1/22 主分类号 H01L21/311
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