发明名称 |
Process and gas mixture for etching silicon dioxide and silicon nitride |
摘要 |
Process and gas mixture for etching silicon dioxide and/or silicon nitride in a plasma environment in a planar reactor. The gas mixture comprises a primary etching gas and a secondary gas which controls the selectivity of the etch. The process is carried out at relatively high pressure and power levels and provides substantially faster removal of silicon dioxide and/or silicon nitride than has heretofore been possible in planar reactors.
|
申请公布号 |
US4324611(A) |
申请公布日期 |
1982.04.13 |
申请号 |
US19800163386 |
申请日期 |
1980.06.26 |
申请人 |
BRANSON INTERNATIONAL PLASMA CORPORATION |
发明人 |
VOGEL, DIANE C.;TANG, MARIAN C.;REICHELDERFER, RICHARD F. |
分类号 |
H01L21/311;(IPC1-7):H01L21/30;C03C15/00;C03C25/06;B44C1/22 |
主分类号 |
H01L21/311 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|