| 摘要 |
<p>An electron microscope comprises a carcass (1) and, mounted horizontally therein, an electron-optical column (3) containing an electron gun (4), electron-magnetic lenses and provided with a sample chamber (5). The electron-optical column (3) is fixed in the carcass (1) by means of shock absorbing devices, each of them being executed as a small-sized ring-shaped spring (11) the plane of its ring being vertically oriented. Each of the ring-shaped springs (11) is connected, through its upper part, to the carcass (1) by means of a coupling element (12) and through its lower part - to the electron-optical column (3) by means of a bandage element (13) executed as a strip partially embracing that column from below. Each of the ring-shaped springs (11) is further connected, through its lateral part, to the carcass (1) by means of fixing plates (14) and (15) connected to each other so that the lateral parts of the ring-shaped spring (11) are clamped between those plates through damping cushions (17), one of the fixing plates being an element of the carcass (1), namely its lateral wall. </p> |
