发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To manufacture a semiconductor device having excellent electric characteristics by providing the steps of heat treating to alloy a semiconductor element and electrodes formed on the element, etching the surface of the element and then baking it in reducing atmosphere. CONSTITUTION:A window for leading out an electrode is opened at a dioxidized silicon film on the surface of a semiconductor element made of an N-P-N transistor, and leading electrode is formed. Then, it is heat treated at 500-550 deg.C in the reducing atmosphere for 10-20min to bake the electrode. Then, it is heat treated to alloy the electrode and the element. Thereafter, the surface of the semiconductor element containing the electrode is etched, is heat treated at 500-550 deg.C in the reducing atmosphere for 5-30min, it is then heat treated at 300 deg.C in the reducing atmosphere for approx. 12hr, thereby obtaining a semiconductor device in which sodium is redistributed as shown by a curve Ie.
申请公布号 JPS5743434(A) 申请公布日期 1982.03.11
申请号 JP19800118753 申请日期 1980.08.28
申请人 TOKYO SHIBAURA DENKI KK 发明人 NISHIGUCHI SUSUMU;HOSOMI SADASHIGE
分类号 H01L21/28;H01L21/324 主分类号 H01L21/28
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