发明名称 MEASURING METHOD OF MICROSCOPIC DISPLACEMENT AND MICROSCOPIC INCLINATION
摘要 PURPOSE:To measure microscopic displacement and inclination, confirming a measuring point, by projecting a visible light beam for confirming a measuring point, and a measuring light beam, on the surface to be measurd, by an optical fiber, and photodetecting a reflected ray by an optical fiber which has been placed adjacently. CONSTITUTION:A light beam is projected from a projecting optical fiber 6, and a reflected ray from a surface 8 is detected by a photodetecting optical fiber 10. The quantity of light which has been reflected by a shaded portion in the figure increases linearly up to a distance d3 where the short diameter (l) is < the diameter D of the fiber, and after that, decreases linearly. In this case, an optical fiber consisting of 3 layers is formed by use of glass whose refractive index is smaller gradually toward the outside from the center. To the center layer is projected a visible light beam for confirming a measuring point, and to an intermediate layer 12 is made incident a measuring light beam. A reflected ray from a ringlike part on th surface 8 is detected by an outside layer 14, and is photoelectrically converted. In case when the detected value is different in each part, inclination of the surface 8 is shown, and in case when it is equal, displacement of the surface 8 is shown, by said value. In this way, microscopic displacement and microscopic inclination are measured, confirming the measuring point.
申请公布号 JPS5735709(A) 申请公布日期 1982.02.26
申请号 JP19800111350 申请日期 1980.08.13
申请人 MITSUTOYO SEISAKUSHO 发明人 EBISAWA HIDEYUKI
分类号 G01C3/06;G01B11/00;G01C1/00;G01C3/00 主分类号 G01C3/06
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