发明名称 METHOD OF PRODUCING SEMICONDUCTOR DEVICE
摘要 A method for providing high density dynamic memory cells which provides self-alignment of both V-MOSFET device elements and their interconnections through the use of a device-defining masking layer having a plurality of parallel thick and thin regions. Holes are etched in portions of the thin regions with the use of an etch mask defining a plurality of parallel regions aligned perpendicular to the regions in the masking layer. V-MOSFET devices having self-aligned gate electrodes are formed in the holes and device interconnecting lines are formed under the remaining portions of the thin regions. A combination of anisotropic etching and directionally dependent etching, such as reaction ion etching, may be used to extend the depth of V-grooves. A method of eliminating the overhang of a masking layer after anisotropic etching includes the oxidation of the V-groove followed by etching to remove both the grown oxide and the overhang is also disclosed.
申请公布号 JPS5734367(A) 申请公布日期 1982.02.24
申请号 JP19810081233 申请日期 1981.05.29
申请人 IBM 发明人 DONARUDO MATSUKARUPIN KENII
分类号 H01L27/10;H01L21/306;H01L21/768;H01L21/8242;H01L27/108;H01L29/74;H01L29/749;H01L29/78 主分类号 H01L27/10
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