| 摘要 |
PURPOSE:To discover the malfunction at the operation of memories for a long time, so-called weak defective loop, in a short time, by pulsating a holding magnetic field at the operation of selection test. CONSTITUTION:Taking notice that malfunction of weak defective loop can be accelerated greatly by pulsating a holding magnetic field known conventionally, which is applied to suppress the deterioration of characteristic through start/stop operation, a bias current to produce a pulsating holding magnetic field is given to two orthogonal coils (X and coils) for rotating magnetic field generation to pulsate the holding magnetic field vector as shown in figure. Thus, the discovery of weak defective loop which cannot be discovered easily conventionally can be made in a short time, by using the means like this. |
