| 摘要 |
PURPOSE:To discriminate at a high speed whether a memory to be measured is normal or not, by counting the number of defective bits accurately. CONSTITUTION:Address information 103 and input data information 104 outputted from a pattern generator 102 are supplied to an FBM101 and a memory 106 to be measured to compare the output 107 of the memory 106 with expected data 105 outputted from the pattern generator and when the both do not coincide with each other, a fail signal 109 is generated to write a 1 in an error address of the FBM101. After the completion of a test, a counter 301 is set to a 0 and addresses are generated and supplied by the pattern generator to the FBM101 successively; after the FBM is read within a prescribed range, the contents of the counter 301 and read to know the number of defective bits. |
