发明名称 TEST METHOD OF ELECTRONIC CIRCUIT DEVICE
摘要 PURPOSE:To reduce the time required for both the detection of fault and the maintenance, by outputting the priority (order of search) of the packages relating to the occurrence of a fault along with the detailed information of the fault. CONSTITUTION:A control circuit b transmits the necessary test data to a device D to be tested from a storage device C and by an indication of the operator, and compares the result of test with a correct answer. In this case, if a dissidence is detected, the detailed information of dissidence is delivered to an input/output circuit. At the same time, the name of fault phase according to the test item is registered in a storage device c. This procedure is carried out for all items of test. After this, the occurring frequency of faults of this time is added with the frequency of each package registered up to the preceding time through a counter circuit f, and the fault retrieving priority is given through a scale checking circuit g to the faults according to the occurring frequency. Then the detailed information is outputted to the input/output circuit. Thus a device is tested based on the detailed information of fault and the order of the pointed-out packages.
申请公布号 JPS5720849(A) 申请公布日期 1982.02.03
申请号 JP19800096076 申请日期 1980.07.14
申请人 FUJITSU LTD 发明人 SONODA KOUZOU
分类号 G06F11/22;G06F11/273 主分类号 G06F11/22
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