发明名称 Method of producing integrated MOS circuits via silicon gate technology
摘要 A method of producing integrated MOS circuits via silicon gate technology with self-adjusting contacts by using silicon nitride masking. In accordance with this method, after etching contact holes for the formation of contacts between monocrystalline doped regions (5) and polysilicon regions (4, 8), or metal interconnections (12), an insulating layer 10 is produced. This insulating layer is produced, after appropriate masking with an oxidation-inhibiting silicon nitride layer of the regions to be connected, from a layer (8) which is additionally applied and doped to correspond to the doped regions in the silicon substrate, and which is converted by local oxidation into the insulating layer (10). This process provides extremely high packing density of circuit elements.
申请公布号 US4313256(A) 申请公布日期 1982.02.02
申请号 US19800109808 申请日期 1980.01.07
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 WIDMANN, DIETRICH
分类号 H01L21/28;H01L21/336;H01L21/768;H01L21/8234;H01L27/06;H01L29/78;(IPC1-7):H01L21/31;H01L21/44 主分类号 H01L21/28
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