| 摘要 |
PURPOSE:To enable to inspect directly the function of a memory array circuit part of the integrated circuit chip having logic circuit parts and the memory array circuit part by a method wherein an electric power source pattern being changeable only the voltage to be supplied to the logic circuit parts is provided. CONSTITUTION:This method is applicable to the circuit chip 11 wherein the memory array circuit 12 is put between the logic circuits 13, and the circuit 12 is not connected directly to input terminals 17 and output terminals 18. The electric source pattern 19' is provided on this chip 11 to make the voltage to be applied from an outside terminal 19 to the circuits 13 as changeable. Action of the circuit is simplified by making the specified transistors constituting respective circuits of NAND, AND, exclusive-OR, data selection, etc., being contained in the circuits 13 to ON changing the voltage of the circuits 13 from the value at the ordinary action. Accordingly electric paths 20 can be formed between data input wires 14, address input wires 15, data output wires 16 to be connected to the circuit 12 and input and output terminals 17, 18, and the circuit 12 can be accessed directly to be inspected. |
