| 摘要 |
PURPOSE:To carry out a circuit test without causing damages to other circuits, by branching and inserting the call/control signal relating to a channel that is desingated optionally among the digital multiplex circuits and by giving a by-passing to other channels. CONSTITUTION:Both the time-division switch TDSW side and the transmission line side are led into the side of the DTI test device TSTE simultaneously via test relay contacts t1 and t2 between a device DTI which terminates the digital multiplex circuit to a time-division digital exchange and the multiple transmission line. Then only the call/control signal relating to the channel to be tested is branched and inserted by the device TSTE, and other channels are by-passed to be set to the original places. In case of an outgoing circuit test, the test board outgoing call is branched by the device TSTE to terminate at the DTI(TSTDTI) which is allotted for the test purpose. In case of an incoming circuit test, the test board outgoing call is transmitted from the TSTDTI and inserted into the test channel by the TSTE to terminate at the TSTTRK of own station. |
