发明名称 ANALYZED SAMPLE POSITION SETTER
摘要 PURPOSE:To control an exciting current for an object lens so as to focus a smaple always at its prescribed position, by obtaining a current fully larger than the exciting current for forming a prescribed focal length, gradually decreasing said current and obtaining the prescribed exciting current. CONSTITUTION:An electron emitted from a filament 1 is irradiated to a sample 11, and a secondary electron generated from the sample 11 is detected by a secondary electron detector 10. X-ray 12, after passing a collimator 14, is detected by an X-ray detector 13. An exciting current for an object lens 7 is controlled in such a manner that the sample is focused in a position with a certain take-out angle of X-rays obtainable. At this time, the object exciting current is controlled by also considering hysteresis characteristics of a magnetic circuit for the object lens, always decreasing the current gradually from an overfocusing state finally focusing the sample at a prescribed position for the analyzed sample.
申请公布号 JPS56141155(A) 申请公布日期 1981.11.04
申请号 JP19800043490 申请日期 1980.04.04
申请人 HITACHI LTD 发明人 YAMADA MITSUHIKO;SHINOHARA MINORU;HIDAKA HIROSHI
分类号 H01J37/20;G01N23/22;H01J37/10;H01J37/252 主分类号 H01J37/20
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