发明名称 MANUFACTURE OF SUBSTRATE FOR PHOTOMASK EVALUATION
摘要 PURPOSE:To form a photomask evaluating substrate having a low defective property by a method wherein a transparent conductive film and a gold film are successively vacuum deposited on the glass substrate installed in a sputtering device. CONSTITUTION:An In or an In+Cr is arranged as an evaporating material in a melting pot 1 of boron nitride 1 having a built-in W heater 3, an Au is arranged in the heating boat consisting of W, Mo or Ta, these melting pot and heating boat are installed in a vacuum evaporating device, the melting pot is heated up in the state wherein oxygen of 2X10<-4> Torr is introduced and 200Angstrom of the In is evaporated on the glass substrate. Then, the induction of the oxygen is discontinued, the melting pot 1 is reheated with the oxygen of 2X10<-5> Torr, and after the Cr of 200Angstrom has been evaporated, the Au of 1,000Angstrom is evaporated by heating up the heating boat. Through these procedures, a multilayer film can be evaporated successively while a vacuum state is maintained and a photomask evaluating substrate having few defects can be obtained, because due consideration is given to the quality of the material of the melting pot and the heating boat.
申请公布号 JPS56125837(A) 申请公布日期 1981.10.02
申请号 JP19800030141 申请日期 1980.03.10
申请人 KONISHIROKU PHOTO IND 发明人 SHINDOU MASANARI;HATANO TAKASHI;SUZUKI MASATOSHI;MARUYAMA AKIRA
分类号 H01L21/66;H01L21/027 主分类号 H01L21/66
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