Testing flat, light-sensitive semiconductors, e.g. solar cells - using sliding-light source and object holder contg. connections to test dosage uniformity

摘要

An arrangement for testing laminar light-sensitive semiconducting components uses a light beam of small dia. It is applicable to testing uniformity in solar cells and enables use of a measurement method which is almost fully automatic. It enables qualitative assessments to be made using statistical analysis resulting in component grading. An optical system able to be moved in the direction of its optical axis produces a small light spot. An object mounting can be moved in a plane perpendicular to the optical axis. The object holder can also be rotated for adjustment purposes and is temp. controlled. An arrangement for fixing the measurement object in place contains its electrical connections, an evaluator, and an adjuster.