| 摘要 |
A dynamic load for testing regulated power supplies comprises a pass transistor or transistors which are controlled by current or voltage regulating means operates under current regulation for loading a voltage regulated power supply and under voltage regulation for loading a current regulated power supply. Only a small bias voltage is required to keep the pass transistor in conduction when the terminal voltage of the power supply under test is programmed to zero output voltage. Otherwise the power required for the dynamic load power supply comes from the power supply under test. Programming the dynamic load power supply provides a complete range of loads to the power supply under test. Additionally, feedback from the power supply under test to the dynamic load power supply can cause the latter to simulate a fixed resistor load. The dynamic load power supply replaces a wide range of the conventional power resistors used for regulated power supply testing.
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