| 摘要 |
PURPOSE:To facilitate an easy detection of the surface flaws, by forming the contour curve group by connecting each of the spots which are equidistant from the contour of the inspection subject that is read in by a raster scan. CONSTITUTION:The data of the inspection object obtained through a raster scan is put into the frame memory A via the AND gate A1. The frame memory B2 is cleared at first. The data of the memory A1 is read out by the address counter 11 to be transferred to the shift registers 7-9, 6, 61, 62, 5, 51 and 52 in that order. When the subject picture element is positioned on the shift register 61, the picture element data SR1-SR8 at each of the positions of the upper left, right above, upper right, left side, right side, lower left, right below and lower right respectively are put into the NAND gate on the screen. The corresponding picture element of the memory B2 becomes ''0'' when the output of the NAND gate is ''0''; and the corresponding pic- ture element of the memory A1 is erased and then turned to ''0'' when the output of the NAND gate is ''1''. With repetition of this procedure, a contour curve group is stored in the memory B2. The this curve group is displayed to ensure an easy detection of the defective areas. |
