发明名称 MANUFACTURING OF HIGHHRESISTANCE ELEMENT
摘要 PURPOSE:To obtain a fine high-resistance element, by injecting oxygen or carbon ion selectively into low-ratio resistance silicon to form high-ratio resistance section and using nonselected portion as a contact terminal. CONSTITUTION:A field oxidation membrane 11 is formed by thermal oxidation of silicon on an isolation section of a water 20 which has a transistor formed on surface of a silicon substrate 10, and a 4,000Angstrom -thick amorphous silicon membrane 2 is coveringly attached onto the membrane 11. And then, it, except a part of the amorphous silicon membrane 2, is covered with the wafer 20 by photoresist, and oxygen or carbon ion is injected to turn a hatched section 2a into a high-ratio resistance. And then, a PSG membrane 13 is attached onto the wafer 20, a contact window or an electrode window 13a for a resistance element is opened and an electrode metal of molybdenum is made to contact a low-ratio resistance section 2b of the amorphous silicon membrane 2 through the window 13a to manufacture a resistance element.
申请公布号 JPS5691458(A) 申请公布日期 1981.07.24
申请号 JP19790168094 申请日期 1979.12.26
申请人 FUJITSU LTD 发明人 SHIRAI KAZUNARI;TANAKA SHINPEI
分类号 H01L27/04;H01L21/02;H01L21/265;H01L21/822 主分类号 H01L27/04
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