发明名称 FLUORESCENT XXRAY ANALYSIS METHOD
摘要 PURPOSE:To analyze fluorescent X-rays of a glass bead sample with a high precision by protruding a ring spacer to the outside circumference of the fluorescent irradiation window and by bringing it into contact with the upper face except the upward curved face of the sample upper face. CONSTITUTION:Ring spacer 1 is protruded to the outside circumference of irradiation window x2 in front of fluorescent X-ray bulb x1. Front end circumference part 1a of ring spacer 1 is brought into contact with the upper face except upward curved face EF near the circumference edge of the upper face of glass bead sample GB to irradiate fluorescent X rays to glass bead sample upper face CF surrounded with front end circumference part 1a of ring spacer 1. As a result, the fluorescent X-ray irradiation distance for flat face CF of the sample is kept constant, and fluorescent X-ray analysis can be performed easily and rapidly without correction of the irradiation distance.
申请公布号 JPS5660337(A) 申请公布日期 1981.05.25
申请号 JP19790135970 申请日期 1979.10.23
申请人 NIPPON STEEL CORP 发明人 OONAMI HIROSHI
分类号 G01N23/223;(IPC1-7):01N23/223 主分类号 G01N23/223
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