发明名称 Apparatus for checking gas analysis devices
摘要 An apparatus for checking gas analysis devices in respect of their sensitivity and their response and regeneration behaviour with respect to time, wherein a reproducible quantity of the measurement component is produced at a predetermined production rate, for a period of time which is guided entirely or at a constant proportion as a concentration pulse to the measurement element of the gas analysis device. For the production of the measurement component a chemical or electro-chemical reaction or even a thermal reaction is used. The time interval can then be conveniently controlled. A decisive advantage with toxic measurement components is that the gas production takes place in all cases for only a short time during the test procedure.
申请公布号 US4267030(A) 申请公布日期 1981.05.12
申请号 US19780970100 申请日期 1978.12.15
申请人 BAYER AKTIENGESELLSCHAFT 发明人 BREUER, WOLFRAM;BECKER, WOLF-JUERGEN;DEPREZ, JACQUES;DROPE, ECKARD;KAUFMANN, KARL-HEINZ;SCHRECKLING, KURT
分类号 G01N27/04;G01N1/00;G01N27/26;G01N33/00;(IPC1-7):C25B1/00;C25B1/26;C25C1/22 主分类号 G01N27/04
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