发明名称 ELECTRON BEAM DEVICE
摘要 PURPOSE:To remove effectively contamination on an electron beam path by providing discharge electrodes in parallel to the inside wall of a conductive pipe member, introducing a clean gas to an inside space, and discharging the contamination through application of a high voltage on the discharge electrodes. CONSTITUTION:Discharge electrodes 22, 22' are provided in the vicinity of the electron beam path wall of an electron lens 7, i.e. the inside wall of a pipe 15, and the electron beam path wall of an electron lens 7', i.e. the inside wall of a protecting pipe 20. The electrodes 22, 22' are electrically insulated from the body by electrode supports 23, 23', and connected to a high voltage source 26 to be supplied with a high voltage through hermetic seals 24, 24' passing through the equipment wall and a switch 25. A leak valve 27 to introduce a clean gas to the inside of the equipment and a needle valve 27 to control the quantity of leak are provided. Thus the pass of the electron beam can be cleaned easily without need for high skill.
申请公布号 JPS5641660(A) 申请公布日期 1981.04.18
申请号 JP19790117365 申请日期 1979.09.14
申请人 HITACHI LTD 发明人 NAMIKAWA YOSHIHISA;KATSUTA SADAHARU
分类号 H01J37/20;G01N23/225;H01J37/02 主分类号 H01J37/20
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