发明名称 TESTING METHOD FOR MICROCOMPUTER
摘要 PURPOSE:To facilitate a test of a microcomputer by detaching elements of a central arithmetic circuit from an IC socket and by connecting a testing device, equipped with elements with the same functions that the central arithmetic circuit has, to the IC socket. CONSTITUTION:Testing device 12 is connected to main microcomputer body 11, having the central arithmetic circuit detached from IC socket 10, via the connection line connected to plug 13. Testing device 12 is equipped with central arithmetic circuit 14 that has the same functions that the detached central arithmetic circuit has. With switch group 15 all open, control bus 18 is connected to control bus 31 via control circuit 17, and further to control bus 2 via plug 13. Similarly, address bus 19 is connected to address bus 3, and data bus 22 to data bus 4. Next, switches in switch group 15 are properly operated to check the functions of main body 11.
申请公布号 JPS5636753(A) 申请公布日期 1981.04.10
申请号 JP19790112441 申请日期 1979.09.04
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 WATANABE TOSHINORI
分类号 G06F11/22;G06F15/78 主分类号 G06F11/22
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