| 摘要 |
PURPOSE:To obtain the information on the crystal structure in the direction perpendicular to a scattering surface without inclining a sample by constituting an X-rays detector in such a manner that said detector moves within the scattering surface and is movable in the plane perpendicular to the scattering surface as well. CONSTITUTION:The X-ray is diffracted by the sample 1 set on a sample table 2 and is detected by the detector 5. The detector 5 is mounted to an arm 6 rotatable around a revolving shaft running the center of the sample within the scattering surface which is the horizontal plane inclusive of the X-ray pas sage between an X-ray source and a sample base. Further, the arm 6 is mounted to a base 4 provided to a detector table 3 which is perpendicular to the scatter ing surface and can rotate around the shaft running the center of the sample. The three-dimensional information on the crystal structure of the surface or boundary face is thereby obtd. without inclining the sample. |
