发明名称 |
Infrared interference type film thickness measuring method and instrument therefor |
摘要 |
An infrared light is applied to a polymer film having a thickness of less than 30 mu , and the infrared light is spectroscopically separated before or after being applied to the polymer film to obtain an infrared interference fringe spectrum based on the polymer film, and then the extreme points of the infrared interference fringe spectrum are detected by processing, whereby to measure the thickness of the polymer film.
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申请公布号 |
US4254337(A) |
申请公布日期 |
1981.03.03 |
申请号 |
US19790070555 |
申请日期 |
1979.08.29 |
申请人 |
ASAHI-DOW LIMITED |
发明人 |
YASUJIMA, AKITAKA;ISHIKAWA, SHINGO |
分类号 |
G01B11/06;(IPC1-7):G01J1/00 |
主分类号 |
G01B11/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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